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Facilities

Powder X-Ray Diffraction (Staples – Chemistry)

High temperature thermal diffusivity instrument (Hogan - Engineering)

AFM, cAFM, in liquid scanning probe facility (Reguera/Zhang – BMB/PA)

Dilatometer (Nicholas - Engineering)

Ellipsometer (Anthony - Engineering)

PPMS (Ke – PA)

Q-sense surface film mass instrument (Tarabara - Engineering)

Absolute absorbance instrument – (McCusker - Chemistry)

Horiba IR spectrometer – (Beaulac - Chemistry)

Materials Studio Software – (Lunt – Engineering)

E-beam writer and etcher (Birge/Pollanen – PA)

Wafer dicing saw

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